发明名称 Methods of forming integrated circuit devices having a resistor pattern and plug pattern that are made from a same material
摘要 An integrated circuit device is formed by forming a resistor pattern on a substrate. An interlayer dielectric layer is formed on the resistor pattern. The interlayer dielectric layer is patterned to form at least one opening that exposes the resistor pattern. A plug pattern is formed that fills the at least one opening and the plug pattern and resistor pattern are formed using a same material.
申请公布号 US7186617(B2) 申请公布日期 2007.03.06
申请号 US20040880919 申请日期 2004.06.30
申请人 发明人
分类号 H01L21/336;H01L21/70;H01L21/8247;H01L27/00;H01L27/08;H01L27/105;H01L31/113 主分类号 H01L21/336
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