发明名称 ECC for component failures using Galois fields
摘要 An apparatus comprises a check bit encoder circuit and a check/correct circuit. The apparatus operates on encoded data blocks, wherein each encoded data block includes a data block, a first plurality of check bits, and a second plurality of check bits. The encoded data block is logically arranged as an array of R rows and N columns, and each of the N columns comprises data bits from a respective one of the plurality of components. The first check bits form a first column of the array, and each of the first check bits covers a row of the array. The second check bits form a second column of the array and are defined to cover bits in the array according to a plurality of check vectors. Each check vector corresponds to a different bit in the array and is an element of a Galois Field (GF(2<SUP>R</SUP>)). The check vectors are derived from a plurality of unique elements of GF(2<SUP>R</SUP>), each of which corresponds to a different column of the array. The check vector in row X of the column is the product, in GF(2<SUP>R</SUP>), of the unique element for that column and alpha<SUP>X</SUP>, wherein alpha is a primitive element of GF(2<SUP>R</SUP>).
申请公布号 US7188296(B1) 申请公布日期 2007.03.06
申请号 US20030696891 申请日期 2003.10.30
申请人 SUN MICROSYSTEMS, INC. 发明人 CYPHER ROBERT E.
分类号 H03M10/00 主分类号 H03M10/00
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