发明名称 Semiconductor device including dual damascene interconnections
摘要 A method (and structure) of forming an interconnect on a semiconductor substrate, includes forming a relatively narrow first structure in a dielectric formed on a semiconductor substrate, forming a relatively wider second structure in the dielectric formed on the semiconductor substrate, forming a liner in the first and second structures such that the first structure is substantially filled and the second structure is substantially unfilled, and forming a metallization over the liner to completely fill the second structure.
申请公布号 US7187085(B2) 申请公布日期 2007.03.06
申请号 US20040853492 申请日期 2004.05.26
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CLEVENGER LAWRENCE A.;NESBIT LARRY A.
分类号 H01L23/48;H01L23/522;H01L21/3205;H01L21/768;H01L23/52;H01L23/532 主分类号 H01L23/48
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