发明名称 SUBSTRATE MATERIAL FOR HANDLING AND ANALYSING SAMPLES
摘要 <p>The invention relates to a substrate material for analyzing one or more fluid samples for the presence, amount or identity of one or more analytes in the samples, whereby the substrate material is adapted in that way that a flow of the sample or parts thereof in and/or with the substrate material is influenced and/or caused by phase transitions, preferably temperature-inducible phase transitions, in selected areas of the substrate material.</p>
申请公布号 WO2007023430(A1) 申请公布日期 2007.03.01
申请号 WO2006IB52842 申请日期 2006.08.17
申请人 KONINKLIJKE PHILIPS ELECTRONICS N. V.;BROER, DIRK, JAN;PENTERMAN, ROEL;PEETERS, EMIEL;KURT, RALPH 发明人 BROER, DIRK, JAN;PENTERMAN, ROEL;PEETERS, EMIEL;KURT, RALPH
分类号 C09K19/00;C09K19/12;G01N33/00;G01N33/483 主分类号 C09K19/00
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