发明名称 DISPLACEMENT MEASURING METHOD, INSTRUMENT THEREFOR, STAGE DEVICE, AND PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To stably measure a displacement amount and a moving amount of a measuring object with a sub-nanometer order or less of precision, without being affected by a disturbance such as air fluctuation and mechanical vibration. SOLUTION: A pulse light is divided into two lights, one thereof is reflected on the measuring object to get incident thereafter into a delay optical path corresponding to one pulse period, the other reaches the measuring object with the one pulse period of lag, after passed through along a reverse direction of the delay optical path in the same optical path, so as to be reflected. An optical phase change generated in accompaniment to the moving of the measuring object is found by bringing the both pulse lights into interference. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007051900(A) 申请公布日期 2007.03.01
申请号 JP20050236292 申请日期 2005.08.17
申请人 HITACHI LTD 发明人 NAKADA TOSHIHIKO;WATANABE MASAHIRO;BABA SHUICHI;NOMOTO MINEO
分类号 G01B11/00;G01B9/02;G01Q10/04;G01Q30/02 主分类号 G01B11/00
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