发明名称 ATOMIC LAYER DEPOSITION METHOD
摘要 The invention includes atomic layer deposition (ALD) methods for forming crystalline materials. The crystalline materials can have a first atomic arrangement within one layer, and a second atomic arrangement within another layer; with the first and second atomic arrangements having different crystallographic orientations relative to one another. Alternatively, or additionally, the crystalline materials can have a first portion with a first concentration of a particular element, and a second portion with a second concentration of the particular element which is different than the first concentration.
申请公布号 US2007049021(A1) 申请公布日期 2007.03.01
申请号 US20050216634 申请日期 2005.08.31
申请人 MICRON TECHNOLOGY, INC. 发明人 BASCERI CEM;SANDHU GURTEJ S.
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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