发明名称 Semiconductor device and method of manufacturing and inspection thereof
摘要 An accelerator sensor of the present invention comprises a semiconductor substrate having a main front surface and a main rear surface, a first groove portion being formed along a front surface pattern, in the main front surface, a second groove portion being formed along a rear surface pattern, in the main rear surface, a through-hole being formed because of connection between at least parts of the first groove portion and the second groove portion and at least one groove width variation portion being formed in at least one of inner walls of the first groove portion. An offset of the rear surface pattern to the front surface pattern can be inspected easily by existence of the groove width variation portion.
申请公布号 US2007044556(A1) 申请公布日期 2007.03.01
申请号 US20060503945 申请日期 2006.08.15
申请人 TASAKI YOSHIHIDE 发明人 TASAKI YOSHIHIDE
分类号 G01P15/00 主分类号 G01P15/00
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