发明名称 Test mode control circuit
摘要 Provided is a test mode control circuit capable of preventing an MRS (mode register set) from changing in a test mode exit after a test mode entry. In the test mode control circuit, an MRS controller logically combines an MRS signal, a bank address, an MRS address, and a test mode control signal to output a latch control signal. A test mode control unit detects a test mode entry and a test mode exit to selectively activate one of a test mode set signal and a test mode exit signal, and outputs the test mode control signal having different voltage levels according to an activation state of the test mode set signal or the test mode exit signal. An address latch latches an input address when the MRS signal is activated, and outputs the latched input address as the MRS address when the latch control signal is activated.
申请公布号 US2007050692(A1) 申请公布日期 2007.03.01
申请号 US20050323382 申请日期 2005.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JANG JI-EUN;PARK KEE-TEOK
分类号 G01R31/28 主分类号 G01R31/28
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