发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device which can be operated at a high speed over a wide temperature range, and to provide a method for operating the semiconductor device so that a semiconductor memory device may not be influenced by variation of temperature. <P>SOLUTION: In this invention, the semiconductor memory device comprises a temperature dependent voltage source for outputting a voltage at its output dependent on a risen temperature measured on the semiconductor memory device. At least one memory cell is provided with at least one first transistor, and the first transistor includes a first transistor main body. The first transistor main body is connected to the output of the temperature dependent voltage source. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007052903(A) |
申请公布日期 |
2007.03.01 |
申请号 |
JP20060219255 |
申请日期 |
2006.08.11 |
申请人 |
QIMONDA AG;NANYA TECHNOLOGY CORP |
发明人 |
RAINER BARTENSCHLAGER;LEE WEN-MING;MUN JIN-SUK;SCHNABEL FLORIAN;CHRISTIAN SICHERT |
分类号 |
G11C11/408;G11C11/409;H01L21/8242;H01L27/108 |
主分类号 |
G11C11/408 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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