发明名称 DEVICE AND METHOD FOR INSPECTION
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for inspection, capable of determining and indicating whether an article determined abnormal (defective) can be made normal (non-defective) by a prescribed treatment. <P>SOLUTION: After performing preprocess (S31, S32) of the wave form signal obtained from the inspection object, the first-layer determination process is performed, determines whether the inspection object is normal (S33 to S35). If the inspection object is normal, this is outputted (S47) to the output device; if determined abnormal, the second-layer determination for determining whether the cause of abnormality can be corrected by the prescribed treatment is performed (S36 to S38). If the treatment is impossible, this is indicated (S43); and if the treatment is possible, the third-layer determination process is performed (S39, S41, S42 and S44), and the obtained method of treatment are outputted, respectively (S43, S45 and S46). <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007051870(A) 申请公布日期 2007.03.01
申请号 JP20050235082 申请日期 2005.08.12
申请人 OMRON CORP 发明人 KUMAMOTO HIROSHI;HIRAYAMA YUJI;FUNAKOSHI AYA;SHIMIZU ATSUSHI
分类号 G01H17/00;G01M99/00;G05B19/418 主分类号 G01H17/00
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