发明名称 Systems and methods for plasma doping microfeature workpieces
摘要 Systems and methods for plasma doping microfeature workpieces are disclosed herein. In one embodiment, a method of implanting boron ions into a region of a workpiece includes generating a plasma in a chamber, selectively applying a pulsed electrical potential to the workpiece with a duty cycle of between approximately 20 percent and approximately 50 percent, and implanting an ion specie into the region of the workpiece.
申请公布号 US2007048453(A1) 申请公布日期 2007.03.01
申请号 US20050217882 申请日期 2005.09.01
申请人 MICRON TECHNOLOGY, INC. 发明人 QIN SHU;MCTEER ALLEN
分类号 C23C14/00;B05C11/00;C23C16/00;H01J7/24;H05H1/24 主分类号 C23C14/00
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