发明名称 High aspect ratio gap fill application using high density plasma chemical vapor deposition
摘要 A high density plasma chemical vapor deposition process including exciting gas mixture to create a plasma including ions, and directing the plasma into a dense region above the upper surface of the semiconductor wafer, heating the wafer using an additional heat source, and allowing a material from the plasma to deposit onto the semiconductor wafer.
申请公布号 US2007049034(A1) 申请公布日期 2007.03.01
申请号 US20050218695 申请日期 2005.09.01
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIOU JOUNG-WEI;LIU TSANG-YU;LIN CHIEN-FENG;CHANG CHENG-LIANG;CHEN MING-TE;LIN CHIA-HUI;TSAI YING-HSIU;WU SZU-AN;LEE YIN-PING
分类号 H01L21/469;C23C16/00 主分类号 H01L21/469
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