发明名称 |
Test modes for a semiconductor integrated circuit device |
摘要 |
A semiconductor integrated circuit device is provided including a switch to selectively supply a test signal to a pin on the integrated circuit device in response to a switch control signal. A control circuit is also provided to generate the switch control signal.
|
申请公布号 |
US2007046308(A1) |
申请公布日期 |
2007.03.01 |
申请号 |
US20050211743 |
申请日期 |
2005.08.26 |
申请人 |
BAKER RONALD;ALEXANDER GEORGE W |
发明人 |
BAKER RONALD;ALEXANDER GEORGE W. |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|