发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a MISFET which improves the mobility of carriers without deteriorating a gate insulating film. SOLUTION: In the MISFET, a portion 25a formed on an element separating region of a gate electrode 5 contains an impurity that changes a lattice constant. A stress in a direction of improving carrier mobility is applied to a channel region, where a starting point of stress application is determined to be the portion 25a of the gate electrode 5. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007053336(A) |
申请公布日期 |
2007.03.01 |
申请号 |
JP20060115869 |
申请日期 |
2006.04.19 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
HIRASE JUNJI;KAJITANI ATSUHIRO |
分类号 |
H01L29/78;H01L21/8234;H01L27/088 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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