发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a MISFET which improves the mobility of carriers without deteriorating a gate insulating film. SOLUTION: In the MISFET, a portion 25a formed on an element separating region of a gate electrode 5 contains an impurity that changes a lattice constant. A stress in a direction of improving carrier mobility is applied to a channel region, where a starting point of stress application is determined to be the portion 25a of the gate electrode 5. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007053336(A) 申请公布日期 2007.03.01
申请号 JP20060115869 申请日期 2006.04.19
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HIRASE JUNJI;KAJITANI ATSUHIRO
分类号 H01L29/78;H01L21/8234;H01L27/088 主分类号 H01L29/78
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