| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device where information is not analyzed even when an analyzing apparatus and a measurement apparatus are connected, and a control method in the semiconductor device. <P>SOLUTION: A load detection circuit 40 detects a load value on a load part 100 via a terminal DQ. A reference load corresponding to a probe load is output from a reference load output part 50. A comparison circuit 60 decides whether or not the detected load value is coincident with the reference load and when it is coincident with each other, the circuit 60 outputs a control signal. When the control signal is input, an input/output buffer 30 stops outputting data to the terminal DQ from a memory cell 10 or outputs specific logic. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
