发明名称 METHOD FOR READING NONVOLATILE MEMORY CELL
摘要 <p><P>PROBLEM TO BE SOLVED: To correctly read an NROM cell storing two bits. <P>SOLUTION: This method includes a step for changing a read reference level for reading a group of memory cells as a function of changes in a threshold voltage distribution of a different group of memory cells. The changing step includes: a step for determining a history read reference level of a group of history cells associated with a group of memory cells of a nonvolatile memory cell array; a step for allowing correct reading of the group of history cells; a step for selecting a memory read reference level according to the first read reference level, and a step for reading the nonvolatile memory array cells. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007052907(A) 申请公布日期 2007.03.01
申请号 JP20060222247 申请日期 2006.08.17
申请人 SAIFUN SEMICONDUCTORS LTD 发明人 SHAPPIR ASSAF;COHEN GUY;LUSKY ELI
分类号 G11C16/06;G11C16/02;G11C16/04 主分类号 G11C16/06
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