发明名称 |
METHOD FOR READING NONVOLATILE MEMORY CELL |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To correctly read an NROM cell storing two bits. <P>SOLUTION: This method includes a step for changing a read reference level for reading a group of memory cells as a function of changes in a threshold voltage distribution of a different group of memory cells. The changing step includes: a step for determining a history read reference level of a group of history cells associated with a group of memory cells of a nonvolatile memory cell array; a step for allowing correct reading of the group of history cells; a step for selecting a memory read reference level according to the first read reference level, and a step for reading the nonvolatile memory array cells. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
申请公布号 |
JP2007052907(A) |
申请公布日期 |
2007.03.01 |
申请号 |
JP20060222247 |
申请日期 |
2006.08.17 |
申请人 |
SAIFUN SEMICONDUCTORS LTD |
发明人 |
SHAPPIR ASSAF;COHEN GUY;LUSKY ELI |
分类号 |
G11C16/06;G11C16/02;G11C16/04 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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