| 发明名称 |
Method and apparatus for diagnosing mass storage device anomalies |
| 摘要 |
A type of flaw present in a mass storage device can be inferred by examining the results of I/O operations performed on only a portion of the device, without testing or examining the entire device.
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| 申请公布号 |
US2007050664(A1) |
申请公布日期 |
2007.03.01 |
| 申请号 |
US20050217642 |
申请日期 |
2005.08.31 |
| 申请人 |
TAN CHENG-PING;PHAN CON D;HINDI FARIS R |
发明人 |
TAN CHENG-PING;PHAN CON D.;HINDI FARIS R. |
| 分类号 |
G06F11/00 |
主分类号 |
G06F11/00 |
| 代理机构 |
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代理人 |
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