发明名称 RING OSCILLATOR STRUCTURE AND METHOD OF SEPARATING RANDOM AND SYSTEMATIC TOLERANCE VALUES
摘要 A ring oscillator test structure comprises at least two overlapping rings that are switchable between different numbers of stages. A delay distribution is measured for various numbers of stages in a set of oscillators formed in different locations subject to different systematic delay effects. The delay distributions are analyzed to isolate the systematic and the random contributions to the standard deviation of the distributions.
申请公布号 US2007050164(A1) 申请公布日期 2007.03.01
申请号 US20050162197 申请日期 2005.08.31
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HABITZ PETER A.;HAYES JERRY D.
分类号 G06F19/00 主分类号 G06F19/00
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