发明名称 CREATING NOVEL STRUCTURES USING DEEP TRENCHING OF ORIENTED SILICON SUBSTRATES
摘要 A potassium hydroxide (KOH) etch process can produce deep high aspect ratio trenches in (110) oriented silicon substrates. The trenches, however, are perpendicular to the (111) direction of the silicon substrate's crystal lattice. The trenches are used to produce thermally isolating areas and through the wafer electrical connections. These structures can be produced in a cost effective manner because of the nearly ideal capabilities of the KOH etch process when it is applied to appropriate materials at appropriate orientations.
申请公布号 WO2007024666(A2) 申请公布日期 2007.03.01
申请号 WO2006US32288 申请日期 2006.08.18
申请人 HONEYWELL INTERNATIONAL INC.;WANG, YONG-FA, A.;DAVIS, RICHARD, A.;REHN, LARRY, A. 发明人 WANG, YONG-FA, A.;DAVIS, RICHARD, A.;REHN, LARRY, A.
分类号 B81C1/00 主分类号 B81C1/00
代理机构 代理人
主权项
地址