| 摘要 |
A device comprising an analytical sample substrate having at least one region that comprises a plurality of sample-support-structures. Each of the sample-support-structures have at least one dimension of about 1 millimeter or less. A sum of areas of contact surfaces of the sample-support-structures is substantially less than a total area of the region. The contact surfaces define a prescribed sample path to an analytical depot located on the analytical sample substrate. |
