发明名称 SEMICONDUCTOR DEVICE
摘要 The present invention aims at providing a semiconductor device that can prevent quality degradation of a signal caused by noise, reduce a malfunction of a circuit caused by latch-up, and secure favorable isolation, and the semiconductor device includes: a first layer with a resistivity higher than 10 Omegacm and lower than 1 kOmegacm which is formed in a semiconductor substrate; a second layer formed on a surface of the semiconductor substrate so as to be located above the first layer; two semiconductor devices formed in the second layer or on the second layer; and a trench-type insulating region which is located between the two semiconductor devices, is formed in the semiconductor substrate so as to reach the first layer from the surface of the semiconductor substrate, and electrically isolates the two semiconductor devices.
申请公布号 US2007045768(A1) 申请公布日期 2007.03.01
申请号 US20060465151 申请日期 2006.08.17
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 YAMANKA MIKI;HIRAOKA YUKIO;ISHIKAWA OSAMU
分类号 H01L29/00 主分类号 H01L29/00
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