发明名称 METHOD FOR PROTECTING A SEMICONDUCTOR DEVICE FROM CARBON DEPLETION BASED DAMAGE
摘要 A method for protecting a semiconductor device from carbon depletion type damage includes enriching an exposed surface of a porous interlevel dielectric material (ILD) with a carbon based material, and implementing a plasma based operation on the porous ILD material. The enriching of the porous ILD material reduces effects of carbon depletion as a result of the plasma based operation.
申请公布号 US2007048981(A1) 申请公布日期 2007.03.01
申请号 US20050162219 申请日期 2005.09.01
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BONILLA GRISELDA;CONTI RICHARD A.;DALTON TIMOTHY J.;FULLER NICHOLAS C.M.;MALONE KELLY;NITTA SATYANARAYANA V.;PONOTH SHOM
分类号 H01L21/04 主分类号 H01L21/04
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