| 摘要 |
The present invention provides an etching process for decreasing mask defect. The process comprises providing a substrate, and sequentually forming a thin film layer, a mask, and a photoresist on the surface of the substrate. Then the photoresist is trimmed by a bromide compound, and a first etching process is performed to transfer patterns from the photoresist to the mask. A strip process is performed to strip photoresist by mixing gases that include fluorine. Finally, a second etching process is performed to transfer the pattern from patterned mask to the thin film layer.
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