发明名称 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 A CAPACITOR CONSISTING OF A STORAGE ELECTRODE (19), A CAPACITOR DIELECTRIC FILM (20) AND A PLATE ELECTRODE (21) IS FORMED IN A TRENCH FORMED THROUGH DIELECTRIC FILMS (6, 8, 10 AND 12) STACKED ON A SEMICONDUCTOR SUBSTRATE (1) AND A BURIED WIRING LAYERS (9 AND 11) ARE FORMED UNDER THE CAPACITOR. AS THE CAPACITOR IS FORMED NOT IN THE SEMICONDUCTOR SUBSTRATE BUT OVER IT, THERE IS ROOM IN AREA IN WHICH THE CAPACITOR CAN BE FORMED AND THE DIFFICULTY OF FORMING WIRING IS REDUCED BY USING THE WIRING LAYERS (9 AND 11) FOR A GLOBAL WORD LINE AND A SELECTOR LINE.
申请公布号 MY128490(A) 申请公布日期 2007.02.28
申请号 MYPI9604769 申请日期 1996.11.18
申请人 HITACHI LTD. 发明人 HIDEYUKI MATSUOKA;KIYOO ITOH;SHIN'ICHIRO KIMURA;TAKESHI SAKATA;TOMONARI SEKIGUCHI;TOSHIAKI YAMANAKA
分类号 H01L27/108;H01L21/02;H01L21/8242;H01L21/8246;H01L27/115;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L27/108
代理机构 代理人
主权项
地址