发明名称 System and method for reduced material pile-up
摘要 <p>An embodiment of the invention pertains to a two stage process that facilitates the formation of a substantially uniform layer. A material is isotropically deposited on a re-entry shaped surface topography and a substrate resulting in a non-wetting film on the re-entry shaped surface topography and the substrate. Regions of the non-wetting film that are not shadowed by the re-entry shaped surface topography are anisotropically removed resulting in non-wetting shadowed films only in the regions that are shadowed by the re-entry shaped surface topography. The non-wetting shadowed films are non-wetting to a subsequently deposited layer. The non-wetting shadowed films reduce pileup at the edges, and so the subsequently deposited layer has a substantially uniform layer thickness.</p>
申请公布号 EP1758183(A1) 申请公布日期 2007.02.28
申请号 EP20060016138 申请日期 2006.08.02
申请人 OSRAM OPTO SEMICONDUCTORS GMBH 发明人 FRISCHKNECHT, KYLE D.
分类号 H01L51/56 主分类号 H01L51/56
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