发明名称 Method for making a semiconductor device that includes a metal gate electrode
摘要 A method for making a semiconductor device is described. That method comprises forming a hard mask and an etch stop layer on a patterned sacrificial gate electrode layer. After first and second spacers are formed on opposite sides of that patterned sacrificial layer, the patterned sacrificial layer is removed to generate a trench that is positioned between the first and second spacers. At least part of the trench is filled with a metal layer.
申请公布号 US7183184(B2) 申请公布日期 2007.02.27
申请号 US20030748545 申请日期 2003.12.29
申请人 INTEL CORPORATION 发明人 DOCZY MARK L.;BRASK JUSTIN K.;KAVALIEROS JACK;SHAH UDAY;BARNS CHRIS E.;CHAU ROBERT S.
分类号 H01L21/3205;H01L21/28;H01L21/336;H01L21/8238;H01L29/49 主分类号 H01L21/3205
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