发明名称 Method of extraction of wire capacitances in LSI device having diagonal wires and extraction program for same
摘要 A method and program for capacitance extraction enabling reduction of the need for division into segments during extraction of capacitances in an LSI device having diagonal wires, so that increases in the number of processes for capacitance extraction can be suppressed are provided. In the method and program, a wire model is generated in which, for a wire segment such that the wire of interest and an adjacent wire are not parallel, either the wire of interest or the adjacent wire is replaced so as to be parallel to the other, and the capacitance of the wire of interest is extracted for this wire model, so that the number of processes in the capacitance extraction process can be reduced.
申请公布号 US7185296(B2) 申请公布日期 2007.02.27
申请号 US20040898960 申请日期 2004.07.27
申请人 FUJITSU LIMITED 发明人 OHBA HISAYOSHI;WATANABE JUN
分类号 G06F17/50;G06F9/45;H01L21/3205;H01L21/82;H01L21/822;H01L23/52;H01L27/04 主分类号 G06F17/50
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