发明名称 Chemical vapor deposition metallization processes and chemical vapor deposition apparatus used therein
摘要 CVD metallization processes and CVD apparatus used therein are provided. The processes include forming a barrier metal layer on a semiconductor substrate and cooling the semiconductor substrate having the barrier metal layer without breaking vacuum. An additional metal layer may be formed on the cooled barrier metal layer. The in-situ cooling process is preferably performed inside a cooling chamber installed between first and second transfer chambers, which are separated from each other. The barrier metal layer may be formed inside a CVD process chamber attached to the first transfer chamber, and the additional metal layer may be formed inside another CVD process chamber attached to the second transfer chamber.
申请公布号 US7183207(B2) 申请公布日期 2007.02.27
申请号 US20040855114 申请日期 2004.05.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG DOO-WON;LEE KAP-SOO;LEE HYUN-JONG
分类号 C23C16/14;H01L21/44;H01L21/205;H01L21/28;H01L21/285;H01L21/768 主分类号 C23C16/14
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