发明名称 Apparatus and method for measuring thermal conductivity
摘要 An apparatus and method for measuring and mapping thermal conductivity and thermal diffusivity at micrometer scale resolution. The apparatus and method utilize a mode-locked femtosecond pulsed laser in a pump-probe configuration to analyze time-domain thermoreflectance of a specimen to evaluate its thermal conductivity in micro-scale, so that, if desired, an image of thermal conductivity distribution of micro-scale regions may be obtained therefrom. A multi-layer, complete three-dimensional model that takes into account the entire three-dimensional heat flow in cylindrical coordinates enables micro-scale measurements to be made at an accuracy of about 90% of well-accepted values.
申请公布号 US7182510(B2) 申请公布日期 2007.02.27
申请号 US20050103660 申请日期 2005.04.04
申请人 CAHILL DAVID GERARD 发明人 CAHILL DAVID GERARD
分类号 G01K1/00;G06F17/00 主分类号 G01K1/00
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