发明名称 Chemical mechanical polishing pad for controlling polishing slurry distribution
摘要 A polishing pad for a chemical mechanical polishing apparatus has a body with a polishing surface having a radius, a central region, and a peripheral region. The polishing surface has a plurality of main radial-line channels extending radially outwardly from the central region to the peripheral region, each main radial-line channel having an angled outer segment at the peripheral region that is directed at an angle relative to a radius of the polishing surface. The polishing surface also has a plurality of primary tributary radial-line channels that are each connected by an angled transition segment to a main radial-line channel, the tributary radial-line channels being spaced apart from the main radial-line channels. The polishing pad provides an improved distribution and flow of polishing slurry during a polishing process.
申请公布号 US7182677(B2) 申请公布日期 2007.02.27
申请号 US20050036903 申请日期 2005.01.14
申请人 APPLIED MATERIALS, INC. 发明人 DONOHUE TIMOTHY JAMES;BALAGANI VENKATA R.;BEAU DE LOMENIE ROMAIN
分类号 B24B5/00;B24D99/00 主分类号 B24B5/00
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