Semiconductor device, semiconductor device testing method, and programming method

摘要

A semiconductor device includes: a latch circuit that latches a given signal in a test mode; and a generating circuit that generates a signal that defines a program voltage used for programming of a memory cell in accordance with the signal latched in the latch circuit. The generating circuit includes: a circuit that generates the signal that defines an initial voltage of the program voltage; a circuit that generates the signal that defines a pulse width of the program voltage; and a circuit that generates the signal that defines a step width of the program voltage when the program voltage is a voltage that increases stepwise.