| 摘要 |
A current-path isolating circuit is provided in a row decoder circuit that selects a part of the plurality of row lines of a memory array and that selectively provides a selected row line with a voltage level different from that for other row lines. In a test mode different from a normal operation mode, the current-path isolating circuit isolates a current path in the device into a first current path for a current flowing through the row line selected and a second current path for a current not flowing through the row line but flowing through the row decoder circuit. The current path isolated is formed to supply a testing voltage to the selected row line from a testing voltage source.
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