发明名称 Method for dicing semiconductor wafers
摘要 A method is disclosed for dicing a wafer having a base material with a diamond structure. The wafer first undergoes a polishing process, in which a predetermined portion of the wafer is polished away from its back side. The wafer is then diced through at least one line along a direction at a predetermined offset angle from a natural cleavage direction of the diamond structure.
申请公布号 US7183137(B2) 申请公布日期 2007.02.27
申请号 US20030725697 申请日期 2003.12.01
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY 发明人 LEE HSIN-HUI;HUANG CHIEN-CHAO;WANG CHAO-HSIUNG;YANG FU-LIANG;HU CHENMING
分类号 H01L21/301;H01L21/50;B28D5/00;H01L21/304;H01L21/78 主分类号 H01L21/301
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