发明名称 Water-barrier performance of an encapsulating film
摘要 A method and apparatus for depositing a material layer onto a substrate is described. The method includes delivering a mixture of precursors for the material layer into a process chamber and depositing the material layer on the substrate at low temperature. The material layer can be used as an encapsulating layer for various display applications which require low temperature deposition process due to thermal instability of underlying materials used. In one aspect, the encapsulating layer includes one or more material layers (multilayer) having one or more barrier layer materials and one or more low-dielectric constant materials. The encapsulating layer thus deposited provides reduced surface roughness, improved water-barrier performance, reduce thermal stress, good step coverage, and can be applied to many substrate types and many substrate sizes. Accordingly, the encapsulating layer thus deposited provides good device lifetime for various display devices, such as OLED devices. In another aspect, a method of depositing an amorphous carbon material on a substrate at low temperature is provided. The amorphous carbon material can be used to reduce thermal stress and prevent the deposited thin film from peeling off the substrate.
申请公布号 US7183197(B2) 申请公布日期 2007.02.27
申请号 US20050133130 申请日期 2005.05.18
申请人 APPLIED MATERIALS, INC. 发明人 WON TAE KYUNG;YADAV SANJAY
分类号 H01L21/4763;C23C8/36;C23C16/34;H01L21/00 主分类号 H01L21/4763
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