发明名称 Failure analysis system and failure analysis method of logic LSI
摘要 A failure analysis system of a logic LSI incorporates software therein. The analysis system includes a function to record the terminal signal information of said logic LSI in synchronization with a clock and a function to reproduce said recorded terminal signal information in synchronization with the clock. The analysis system further includes a function to compare said reproduced terminal signal information with the terminal signal information of a normal logic LSI.
申请公布号 US7185248(B2) 申请公布日期 2007.02.27
申请号 US20030621603 申请日期 2003.07.18
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 KONDO TAKAYUKI
分类号 G01R31/28;G01R31/3177;G01R31/3183;G06F11/00;G06F11/22;G06F11/25;G11B5/02;G11B5/09 主分类号 G01R31/28
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