发明名称 |
Failure analysis system and failure analysis method of logic LSI |
摘要 |
A failure analysis system of a logic LSI incorporates software therein. The analysis system includes a function to record the terminal signal information of said logic LSI in synchronization with a clock and a function to reproduce said recorded terminal signal information in synchronization with the clock. The analysis system further includes a function to compare said reproduced terminal signal information with the terminal signal information of a normal logic LSI.
|
申请公布号 |
US7185248(B2) |
申请公布日期 |
2007.02.27 |
申请号 |
US20030621603 |
申请日期 |
2003.07.18 |
申请人 |
OKI ELECTRIC INDUSTRY CO., LTD. |
发明人 |
KONDO TAKAYUKI |
分类号 |
G01R31/28;G01R31/3177;G01R31/3183;G06F11/00;G06F11/22;G06F11/25;G11B5/02;G11B5/09 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|