| 摘要 |
The methodology includes a single excitation analysis, a multi-excitation analysis, and a simultaneous switch noise, SSN, analysis. A chip connects to the PDS at a plurality of power ports formed by pads for obtaining biasing voltage and current from those power ports. The single excitation analysis includes respectively making each of power ports start conducting current, and measuring a voltage provided by the power port. An equivalent impedance of each power port is obtained. The multi-excitation analysis includes making a given power port conduct a given current, and measuring voltages at other power ports for evaluating mutual couplings across different power ports. The SSN analysis includes respectively making different numbers of power ports conduct currents and accordingly evaluating different equivalent impedances corresponding to different SSN situations. |
