| 摘要 |
It is judged whether or not a scan chin has a failure, an arbitrary data string is inputted to the malfunction scan chain judged that a failure is present by a capture action through a combination circuit, the data string is outputted from a scan-out terminal of the malfunction scan chain to which the data string is inputted, and the failure position of the malfunction scan chain is specified based on a comparison between the outputted data string and the expected value of the data string.
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