发明名称 ATMOSPHERIC PROCESS AND SYSTEM FOR CONTROLLED AND RAPID REMOVAL OF POLYMERS FROM HIGH ASPECT RATIO HOLES
摘要 A system that generates an intense hot gas stream is described to etch a polymer on a substrate used in the manufacture of semiconductor and MEMS devices with no surface damage. The etching process is particularly useful to remove a polymer from relatively high aspect Height-to-Width and Width-to-Height ratio holes that can include trenches, having relatively large aspect ratios for removal of polymers used in connection with the manufacturing of microstructures.
申请公布号 WO2007021855(A2) 申请公布日期 2007.02.22
申请号 WO2006US31219 申请日期 2006.08.11
申请人 JETEK, LLC;BOLLINGER, LYNN, DAVID;TOKMOULINE, ISKANDER 发明人 BOLLINGER, LYNN, DAVID;TOKMOULINE, ISKANDER
分类号 H01L21/302;H01L21/324 主分类号 H01L21/302
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