发明名称 DEVICE AND METHOD FOR PROCESSING PLASMA
摘要 <P>PROBLEM TO BE SOLVED: To provide a device and a method for processing plasma, which easily conduct a desorption of a substrate after it is held and processed with an electrostatic absorption. <P>SOLUTION: The plasma processing device comprises: a processing chamber 101 for plasma processing the substrate 103 to be processed; plasma generating means 105 to 108 for generating the plasma in the processing chamber 101; a wafer stage 102 having an electrostatic chuck for holding the substrate 103 to be processed provided within the processing chamber 101; a detecting means 114 of a leak current value flowing in a circuit formed by a power supply 112 for the elctrostatic absorption, the electrostatic chuck 102, the substrate 103, the plasma 109, an earth line 113; and a means 115 for controlling an applying voltage, so as to set an absorption condition by the current value to reach the set current value. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007048986(A) 申请公布日期 2007.02.22
申请号 JP20050232608 申请日期 2005.08.10
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KITSUNAI HIROYUKI;SUGANO SEIICHIRO;TSUBONE TSUNEHIKO
分类号 H01L21/683;H01L21/3065;H05H1/46 主分类号 H01L21/683
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