ATOM PROBES, ATOM PROBE SPECIMENS, AND ASSOCIATED METHODS
摘要
<p>The present invention relates generally to atom probes, atom probe specimens, and associated methods. For example, certain aspects are directed toward methods for analyzing a portion of a specimen that includes selecting a region of interest and moving a portion of material in a border region proximate to the region of interest so that at least a portion of the region of interest protrudes relative to at least a portion of the border region. The method further includes analyzing a portion of the region of interest. Other aspects of the invention are directed toward a method for applying photonic energy in an atom probe process by passing photonic energy through a lens system separated from a photonic device and spaced apart from the photonic device. Yet other aspects of the invention are directed toward a method for reflecting photonic energy off an outer surface of an electrode onto a specimen.</p>
申请公布号
WO2007022265(A2)
申请公布日期
2007.02.22
申请号
WO2006US31982
申请日期
2006.08.15
申请人
IMAGO SCIENTIFIC INSTRUMENTS CORPORATION;KELLY, THOMAS, F.;BUNTON, JOSEPH, HALE;WIENER, SCOTT, ALBERT
发明人
KELLY, THOMAS, F.;BUNTON, JOSEPH, HALE;WIENER, SCOTT, ALBERT