发明名称
摘要 <P>PROBLEM TO BE SOLVED: To provide a p-type gallium nitride compound semiconductor formed of a gallium nitride compound semiconductor layer doped with a p-type impurity. <P>SOLUTION: The gallium nitride compound semiconductor comprises: an n-type gallium nitride compound semiconductor layer containing at least silicon; and a p-type gallium nitride compound semiconductor layer containing at least magnesium. The semiconductor further comprises: a cap layer which can uniformly retrieve at least a partial hydrogen dissociated from magnesium from the gallium nitride compound semiconductor layer suppressing the dissociation of a gallium nitride compound semiconductor in annealing and containing the magnesium in the depth direction and which has a film thickness of 0.01 &mu;m on the gallium nitride compound semiconductor layer containing the magnesium. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP3884717(B2) 申请公布日期 2007.02.21
申请号 JP20030064147 申请日期 2003.03.10
申请人 发明人
分类号 H01L21/205;H01L21/324;H01L33/32 主分类号 H01L21/205
代理机构 代理人
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