发明名称 Polishing pad, a polishing apparatus, and a process for using the polishing pad
摘要 A polishing pad can include a first layer and a second layer. The first layer can have a first polishing surface and a first opening. The second layer can have an attaching surface and a second opening substantially contiguous with the first opening. The polishing pad can further include a pad window lying within the first opening. The pad window can include a second polishing surface and a gas-permeable material. In one aspect, an apparatus can include an attaching surface of a platen lying adjacent to the attaching surface of the polishing pad. In another aspect, a process for polishing can include changing a temperature of a gas within a spaced-apart region formed between a pad and a platen. The process can also include forming a gas flux across the polishing pad after polishing has started.
申请公布号 US7179151(B1) 申请公布日期 2007.02.20
申请号 US20060390292 申请日期 2006.03.27
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 BOTTEMA BRIAN E.;ABRAHAM STEPHEN F.;PAMATAT ALEX P.
分类号 B24B1/00 主分类号 B24B1/00
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