发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device includes a substrate including a semiconductor and a trench, and an electrically rewritable semiconductor memory cell on the substrate, the semiconductor memory cell comprising a charge storage layer including an upper surface and a lower surface, an area of the lower surface being smaller than an area of the upper surface, and at least a part of the charge storage layer being provided in the trench, first insulating layer between the lower surface of the charge storage layer and a bottom surface of the trench, second insulating layer between a side surface of the trench and a side surface of the charge storage layer and between the side surface of the trench and a side surface of the first insulating layer, third insulating layer on the charge storage layer, and a control gate electrode on the third insulating layer.
申请公布号 US7180121(B2) 申请公布日期 2007.02.20
申请号 US20050085197 申请日期 2005.03.22
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HIEDA KATSUHIKO
分类号 H01L21/8247;H01L27/108;H01L21/336;H01L21/8242;H01L27/105;H01L27/115;H01L29/76;H01L29/788;H01L29/792;H01L29/94;H01L31/113;H01L31/119 主分类号 H01L21/8247
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