发明名称 TEST APPARATUS AND TEST METHOD
摘要 a first signal comparator for acquiring a first output pattern string by comparing an output signal voltage at the first strobe timing to a first threshold value voltage so as to acquire a value of the output pattern according to the comparison result; a second signal comparator for acquiring a second output pattern string by comparing an output signal voltage at the second strobe timing to a second threshold value voltage so as to acquire a value of the output pattern according to the comparison result; a header pattern string detection unit for detecting coincidence between the first output pattern and the header pattern string; and an expectation value comparison unit used when the coincidence between the first output pattern string and the header pattern string is detected, for outputting the result of comparison between the second output pattern string acquired by the second signal comparator and the expectation value pattern string. ® KIPO & WIPO 2007
申请公布号 KR20070020161(A) 申请公布日期 2007.02.20
申请号 KR20057022862 申请日期 2005.11.29
申请人 ADVANTEST CORPORATION 发明人 OZORA SATOSHI;NAKAGAWA TETSURO;TSUNODA MAKOTO;TAKAIWA NOBUMASA
分类号 G01R31/319;G01R31/30;G01R31/3193 主分类号 G01R31/319
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