发明名称 Semiconductor assembly having substrate with electroplated contact pads
摘要 An apparatus comprising an insulating substrate ( 101 ) having first and second surfaces ( 101 a , 101 b) and a plurality of metal-filled vias ( 102 ) extending from the first to the second surface. The first and second surfaces have contact pads ( 103, 104 ), each one comprising a connector stack to at least one of the vias. The stack comprises a seed metal layer ( 110 , copper) in contact with the via metal capable of providing an adhesive and conductive layer for electroplating on its surface, a first electroplated support layer ( 111 a, copper) secured to the seed metal layer, a second electroplated support layer ( 111 b, nickel), and at least one reflow metal bonding layer ( 112 , palladium, gold) on the second support layer. The electrolytic plating process produces support layers substantially pure (at least 99.0%), free of unwanted additives such as phosphorus or boron, and exhibiting closely controlled grain sizes. Reflow metal connectors ( 220, 230 ) provide attachment to chip contact pads and external parts.
申请公布号 US7179738(B2) 申请公布日期 2007.02.20
申请号 US20040985757 申请日期 2004.11.09
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 ABBOTT DONALD C.
分类号 H01L21/445;H01L21/28;H01L21/44;H01L23/498;H01L27/095;H01L29/47;H01L29/812;H01L31/07;H01L31/108;H05K1/11;H05K3/24;H05K3/34 主分类号 H01L21/445
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