| 摘要 |
A self-calibrating test probe system that does not require probing head removal and replacement for calibration or may self-calibration is described. Using this system, the test probe and/or the entire system (including a testing instrument) may be calibrated or may self-calibrate while the probing head remains connected to an electrical component under test. A self-calibrating electrical testing probe includes a cable or signal path having a probing head at a first end and a connector at a second end. Calibration circuitry is preferably at least partially located in said test probe. The calibration circuitry preferably includes switch technology. The switch technology may be at least partially located in said probing head.
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