| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical measuring device capable of shortening a measuring time of a measuring object having a low reflectance. SOLUTION: This optical measuring device 10 includes a wavelength selection means and a sensitivity changing means. The wavelength selection means is constituted of a wavelength selection part 22 arranged on an optical path from a light source 21 to a light receiving element 41, for selecting the wavelength of passing light. A bias voltage Vb is supplied to the light receiving element 41, and the light receiving element 41 outputs a light receiving signal S3 having a level corresponding to incidence light with light receiving sensitivity corresponding to the bias voltage Vb. A measuring part 26 changes the bias voltage Vb by a sensitivity changing part 44 when the level of the light receiving signal S3 is lower than a measuring level. COPYRIGHT: (C)2007,JPO&INPIT
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