发明名称 Planarizing a semiconductor structure to form replacement metal gates
摘要 A sacrificial gate structure, including nitride and fill layers, may be replaced with a metal gate electrode. The metal gate electrode may again be covered with a nitride layer covered by a fill layer. The replacement of the nitride and fill layers may reintroduce strain and provide an etch stop.
申请公布号 US2007037372(A1) 申请公布日期 2007.02.15
申请号 US20060581183 申请日期 2006.10.13
申请人 KAVALIEROS JACK;BRASK JUSTIN K;DOCZY MARK L;SHAH UDAY;BARNS CHRIS E;METZ MATTHEW V;DATTA SUMAN;CHAU ROBERT S 发明人 KAVALIEROS JACK;BRASK JUSTIN K.;DOCZY MARK L.;SHAH UDAY;BARNS CHRIS E.;METZ MATTHEW V.;DATTA SUMAN;CHAU ROBERT S.
分类号 H01L21/3205 主分类号 H01L21/3205
代理机构 代理人
主权项
地址