METHOD OF X-RAY DIFFRACTIOIN ANALYSIS PROPOSED BY V.D. DOBROVOLSKYI AND L.K.SHVEDOV

摘要

The proposed method of X-ray diffraction analysis can be used for analyzing the atomic and crystalline structure and the physical and chemical properties of substances. The method consists in installing the X-ray tube on the diffractometer, installing the sample to be analyzed on the table of the goniometer, exposing the sample to X-radiation, forming the rectangular projection of the focal spot, and measuring the intensity of the diffracted X-radiation by a detector. The X-ray tube is installed with a possibility to be rotated at 90 degrees. The present invention provides a possibility to increase the intensity of the diffraction pattern when analyzing small-size samples and reduce the analysis duration while using standard equipment.