发明名称 Methods of forming and using memory cell structures
摘要 A method of filling vias for a PCRAM cell with a metal is described. A PCRAM intermediate structure including a substrate, a first conductor, and an insulator through which a via extends has a metallic material formed within the via and on a surface of the insulator. The metallic material may be deposited on the surface and within the via. A hard mask of a flowable oxide is deposited over the metallic material in the via to protect the metallic material in the via. A subsequent dry sputter etch removes the metallic material from the surface of the insulator and a portion of the hard mask. After complete removal of the hard mask, a glass material is recessed over the metallic material in the via. Then, a layer of a metal-containing material is formed over the glass material. Finally, a second conductor is formed on the surface of the insulator.
申请公布号 US2007035041(A1) 申请公布日期 2007.02.15
申请号 US20060516730 申请日期 2006.09.07
申请人 LI LI;LI JIUTAO 发明人 LI LI;LI JIUTAO
分类号 H01L21/44;H01L21/4763;H01L45/00 主分类号 H01L21/44
代理机构 代理人
主权项
地址